(c)
115-VZC Power (V A)
1) The purpose of this test is to detect and provide an early warning of ac voltage reduction. Continuous monitoring will sense the power going below that required for normal operation, immediately go into a power down interrupt routine, and store a failure diagnostic. If, after one frame (50 ms), power is restored or hardware does not disconnect, a continuation of processing will occur.
(d)
28-VDC power (V D)
1) The purpose of this test is to detect, and provide and early warning of dc power. If the discrete is lost, the software will immediately go into a power down interrupt routine and store the failure diagnostic. If, after one frame (50 ms), power is restored or hardware does not disconnect a continuation of processing will occur.
(e)
Ticket Count (T C)
1) The purpose of this test is to monitor that the software executive directs the software schedule such that all the major critical modules are exercised during a single frame cycle. A continuous check is made to ensure that all software modules are executed. One missing ticket “punch.” Indicating a module has been bypassed, will cause fault storage and reaction.
(f)
Logic Software (L S)
1) The purpose of this test is to verify the correct sequencing of the minor frames within the major computer frame cycle, and that the correct modules are exercised during F/D independence. Alternate frames are monitored to verify odd/event parity sequences. Flight director independence state is also monitored and the processing of any routine which should be inhibited during the independent phase are stored. If an out of sequence or nonindependent F/D module is exercised, the software goes into a fault reaction and storage routine.
(g)
EROM Test (R O)
1) The purpose of this test is to verify that a specified segment of EROM (Erasable Read Only Memory) is in its original load configuration. The sum of all the application program EROM specified location values are computed and compared with a stored checksum value. A mismatch caused an error to be placed into the linear stack and program control goes to the restart location.
(h)
Selective RAM Test (R A)
1) The purpose of the Selective RAM (Random Access Memory) test routine is to detect a continuous hardware memory failure. Each memory chip boundary of selectively mapped memory words are examined for the ability to store and retrieve zero’s and ones. A minimum number of memory location and portions of words are selected such that every RAM hardware memory component is exercised. Failure of this test caused an error indication in the linear stack and the program control is transferred to the restart location.
(i)
SPD-175 CPU Instruction Diagnostic Test (C P)
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1) The purpose of this CPU Introduction Diagnostic test is to detect faults in the improper execution of the hardware program register usage, and chip-pin faults. Each implemented instruction of the class “nonprivileged” is exercised for correct execution and the results are examined and compared to the previous test. An error is placed into the linear stack and the program is transferred to the restart location.
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H19166
580 Continuous Monitor Diagnostic Display Format
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AP/FD Bite Sequence Diagram 5C9
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553 AP/FD Bite Sequence Diagram
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H87971
AP/FD BITE Test Summary 553
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APPROX TEST TIME, MINUTES
DISPLAY TEST GROUP NO SURFACE SURFACE TEST COMMENTS
ADI 24 1.0 0 FCC INTERFACE 25 5.4 0 DADC, ALP VANE 26 .6 0 VG, LRRA, ACCEL 27 .6 0 HSI 28 1.2 0 VOR/ILS RCVR, DME 29 1.0 0 COMPASS 30 .7 0 MODE ANN 31 1.5 0 MINI LAND 32 .3 5.2 FULL LAND 33 16.0 13.4 ALL PITCH 34 --ALL ROLL 35 --OMEGA 36 --
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